Introduction to Scanning Probe Microscopy (Spm)

Course content

Principles of tunneling phenomena & Scanning Tunneling Microscope (STM) Theory, scanning mechanisms: piezoelectric and coil, course approach, vibration isolation, data acquisition, feedback control: analog, digital, feed forward etc., Atomic Force Microscopy (AFM): theory, force detection methods in AFM, contact mode AFM, tapping mode AFM, non-contact mode operation of AFM & true atomic resolution, atomic manipulation, nanolithography, fast SPMs, SPM in liquids, operation in extreme environments, other SPM methods: MFM, SHPM, EFM, NSOM etc.